The X-Ray diffraction technique is used to determine the crystal structure and interatomic spacing of crystallinesamples through constructive interference of reflected x-ray beams.
Bragg's Law and X-Ray diffraction data, in combination with the expressions for interatomic spacing in terms of the lattice parameter and Miller indices for acrystal, can be utilized to identify crystal structures, determine lattice constants, and locate defects within astructure.
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